HP / Agilent 8753E

HP 8753E RF Network Analyzer

The HP 8753E RF network analyzer offers an unbeatable combination of speed, performance and ease-of-use to meet your measurement needs, whether in the R&D laboratory or on the production floor. With an integrated S-parameter test set covering 30 kHz to 3 or 6 GHz, up to 110 dB of dynamic range, and both frequency and power sweeps, the HP 8753E gives you a complete solution for characterizing the linear and nonlinear behavior of active and passive networks, devices, components and sub-systems. A new processor has been incorporated which makes measurement and data-transfer speeds up to seven times faster than the previous model.

The network analyzer features two independent measurement channels that can measure and display all four S-parameters simultaneously. You can choose to display any combination of reflection and transmission parameters, with magnitude, phase, group-delay, Smithchart, polar, SWR, or time-domain formats. Easy-to-use softkeys let you access measurement functions quickly, and you can view results in overlay or split-screen format on the crisp, LCD color display using one, two or four graticules. A VGA-compatible output has been added to drive larger external monitors for optimum viewing.

Maximum Versatility and Performance

An integrated, synthesized source provides up to 10 mW of output power (100 mW for Option Oil), 1Hz frequency resolution, and linearfrequency, log-frequency, list-frequency, CW, and power sweep types. Three tuned receivers allow independent power measurements or simultaneous ratio measurements over a wide dynamic range of 105 dB at 6 GHz (with Option 006 frequency extension) or 110 dB at 3 GHz (standard).The integrated test set allows you to measure transmission and reflection characteristics of a device to 6 GHz without a frequency doubler.

TRL*/LRM*  calibration is available for convenient, accurate measurements in noncoaxial environments. An adapter-removal calibration technique has been added for highly-accurate measurements of non-insertable devices. A high-stability frequency reference, Option 1D5, improves the frequency accuracy of measurements of high-Q devices such as SAW and crystal resonators or dielectric-resonance filters. For configuration flexibility, Option 011 deletes the built-in test set so that you can select your own. The HP 8753E Option 011 works with the HP85046A/B and 85047AS-parameter test sets, and other specialized test sets for specific applications.