Associated Research 7564SA

KEY FEATURES & BENEFITS SUMMARY: MODEL 7564SA

The first complete systems to include AC Hipot, DC Hipot, Insulation Resistance and Ground Bond test into a single 19 inch rack mount cabinet QUADCHEK II combines the three most common dielectric safety tests (AC Hipot, DC Hipot & IR test) along with a high current Ground Bond test into a single instrument which takes up less rack space and enables a single DUT connection..

RS232 interface All the functions of the instrument can be programmed over the interface which makes the instrument adaptable to any type of automated production environment.

Includes optional built-in 8 port scanner and an interface to control up to two external scanners for expansion capabilities up to 16 ports These optional scanner configurations are ideal for multipoint testing of a single item or multiple product testing. The high voltage outputs of either the internal or external scanner can be set as high, low or off. A front panel display shows the status of each scanner output port. The scanner for use with the QUADCHEK II also offers 8 ports for high current Ground Bond testing.

A single 2 x 20 LCD display provides a clear indication of all test results and setup parameters This single easy-to-view and simple-to-interpret LCD display allows the operator to monitor all test activity.

All setup parameters can be adjusted through a simple menu driven program with hot keys to quickly access all functions by using the front panel The operator is provided with an easy and safe way to set trip currents and output voltages since all parameters are set without high volta e activated. The easy to follow menu ensures that the operator correctly sets up each test mode.

Storage of up to 50 setups with 8 steps per setup A real benefit for manufacturers that test different products. Each setup can store up to 8 steps that can be configured to perform any of the safety tests. In addition each setup can be linked to the next for setting up as many as 400 steps in sequence.

Exclusive CHARGE LO and RAMP HI testing features allow for more effective DC Hipot testing The RAMP HI feature allows the user to set a higher trip rate during the ramp to allow for quick charging of the product without nuisance tripping thereby increasing throughput when testing with DC. The CHARGE LO provides the user with the capability to ensure that the device under test is connected correctly.

Exclusive SmartGFI function The SmartGFI (patent pending) provides maximum operator protection to the user. If the circuit detects excessive leakage to ground it shuts down the high voltage in less than 1 millisecond. SmartGFI is automatically activated if the DUT is not grounded. The operator does not need to make the decision whether to activate the SmartGFI.

Programmable security password system Avoids tampering with settings by only allowing authorized personnel with a user programmable security password to change test parameters.

Line and Load regulation Maintains the output voltage to within 1% of setting even if the load or the line voltage varies. This ensures that the test results remain consistent and within safety agency requirements. 

PLC remote inputs & outputs This allows the instruments to be remotely monitored and set up completely through simple PLC control. 

Up to 40mA of current is available in AC Hipot mode and 10mA in DC Hipot mode with resolutions of 10 µA in AC and 1 µA in DC This makes these instruments true hipot testers with enough output current to test even highly capacitive loads while allowing them to be versatile enough to monitor leakage current of items with very low leakage measurement requirements. 

Digitally controlled arc detection system Allows the operator to select whether low level arcs should be detected and provides the operator with the ability to digitally select and program multiple sensitivity levels. 

Four wire measurement (Kelvin Method) and milliohm offset capability in the Ground Bond mode The four wire measurement technique eliminates test lead resistance when using the standard test leads. The milliohm offset function allows the use of longer test leads and test fixtures without compromising test results.