Tektronix TDS8000B

Features & Benefits

• DC to 70+ GHz Bandwidth*¹
• Exceptional Trigger Jitter and Horizontal Timebase Stability
• Modular Architecture
• Up to Eight Channels Acquisition
• High Resolution and Measurement Repeatability
• Comprehensive, Accurate, Automatic Measurement System
• Intuitive User Interface
  • Large Display (10.4 in.)
  • Microsoft Windows-based Graphical User Interface
• Windows 2000 for enhanced network security

Applications

• Semiconductor Testing
• Impedance and Crosstalk Characterization (using TDR)
• High-speed Digital Data Communications

*¹ Bandwidth is determined by plug-in modules and may exceed 70 GHz should higher speed modules become available in the future.

The TDS8000B Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform-processing capabilities of any ultra-high bandwidth oscilloscope. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the TDS8000B is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages, cables and high-speed digital communications.

State-of-the-art Waveform Acquisition

The TDS8000 Series' state-of-the-art timebase provides equivalent time sweep speeds from 1.0 ps/div to 5 ms/div with record lengths from 20 to 4000 points and a sample interval down to 10 femtoseconds (0.01 ps). In addition, the 8000 Series Sampling Oscilloscopes' timebases can be locked to a 10 MHz reference providing greater long-term stability. This capability also allows multiple TDS8000Bs to be synchronized to other test equipment and/or the device-under-test.

The TDS8000B offers two magnification windows, whereby sections of the main trace are re-acquired at higher resolution for closer examination of details.

The TDS8000B boasts the highest sample rate among sampling oscilloscopes. Its multi-processor architecture, with dedicated per channel digital signal processors (DSP), guarantees the highest waveform acquisition rates regardless of the number of channels acquired or waveform processing done.

Modularity and Flexibility

The TDS8000B supports a large and growing family of electrical and optical plug-in modules. This modular architecture lets you configure the instrument with the right features for your application both now and in the future.

The electrical plug-ins include a variety of modules with typical bandwidths up to 70+ GHz and specialized features such as TDR for impedance and crosstalk characterizations. High bandwidth probes are also available for constructing a total acquisition solution.

The available optical modules provide complete optical test solutions for both telecom (155 Mb/s to 43 Gb/s) and datacom (Fibre Channel, InfiniBand and Gigabit Ethernet) applications as well as general-purpose optical signal testing.

Unmatched TDR Capabilities

With the 80E04 TDR Sampling Module, the TDS8000B offers unmatched TDR performance on up to eight channels simultaneously. Each channel has an independent polarity selectable step-generator offering unmatched 35 ps reflected rise time*². The TDS8000B provides the only true differential TDR system available today. Automatic, transparent correction for variations in step amplitude and baseline offset guarantee accuracy and repeatability of impedance measurements.

8000 Series Sampling Oscilloscope Platform

The TDS8000B is built on Tektronix' sampling oscilloscope platform that combines familiar MS Windows-based PC technologies with world-class waveform acquisition technology.

This platform provides a wide array of standard instrumentation and communications interfaces (such as GPIB, parallel printer port, RS-232-C and USB serial ports and an Ethernet LAN connection). In addition, the platform includes several mass storage devices (floppy disk, removable hard drive and CD-ROM).

The TDS8000B is equipped with a large, full-color display that helps you discriminate waveform details. Color-grading of waveform data adds a third dimension - sample density - to your signal acquisitions and analysis.

Gated triggering, a feature that allows the exclusion of selected time periods from being measured, is offered as an option.

Because the system supports an open MS Windows environment, new levels of data analysis can be done directly on the instrument using commercially available software packages.

Additionally, TekVISA, a standard software feature, allows the instrument to be placed under the control of software applications (e.g. LabView, LabWindows, Visual Ba