Spectrum Analyzer
The Tektronix MDO343BW100 100 MHz, 4-Channel, 2.5 GS/s Mixed Domain Oscilloscope with 8-bit Vertical Resolution and 11.6 in. HD Touchscreen, 10 M Record Length adds more capability to your bench - with an included spectrum analyzer and separate RF inputs, the MDO34 allows you to quickly debug your designs and track down sources of unwanted EMI emissions, without tracking down a standalone analyzer.
The Settings Bar - key parameters and waveform management
Waveform and scope operating parameters are displayed in a series of badges in the Settings Bar that runs along the bottom of the display. The Settings Bar provides immediate access for the most common waveform management tasks.
The Results Bar - analysis and measurements
The Results Bar on the right side of the display includes immediate, one tap access to the most common analytical tools such as cursors, measurements, searches and bus decode results tables.
Cursors, measurements and search results badges are displayed in the Results Bar without sacrificing any waveform viewing area. For additional waveform viewing area, the Results Bar can be dismissed and brought back at any time.
Scopes have included touch screens for years, but the touch screen has been an afterthought. The MDO34 11.6 inch display includes a capacitive touchscreen and provides a user interface truly designed for touch.
The touch interactions that you use with phones and tablets, and expect in a touch enabled device, are supported in the MDO34.
Smooth, responsive front panel controls allow you to make adjustments with familiar knobs and buttons, and you can add a mouse or keyboard as a third interaction method.
At the core of the MDO34 is a world-class oscilloscope, offering comprehensive tools that speed each stage of debug - from quickly discovering anomalies and capturing them, to searching your waveform record for events of interest and analyzing their characteristics and your device's behavior.
To debug a design problem, first you must know it exists. Every design engineer spends time looking for problems in their design, a time consuming and frustrating task without the right debug tools.
FastAcq Waveform Capture
Digital phosphor technology provides you with fast insight into the real operation of your device. Its fast waveform capture rate - greater than 280,000 wfms/s with FastAcq - gives you a high probability of quickly seeing the infrequent problems common in digital systems: runt pulses, glitches, timing issues, and more.
To further enhance the visibility of rarely occurring events, intensity grading is used to indicate how often rare transients are occurring relative to normal signal characteristics. There are four waveform palettes available in FastAcq acquisition mode.
These color palettes quickly highlight the events that over time occur more often or, in the case of infrequent anomalies, occur less often.
Infinite or variable persistence choices determine how long waveforms stay on the display, helping you to determine how often an anomaly is occurring.
Discovering a device fault is only the first step. Next, you must capture the event of interest to identify root cause. To enable this, the MDO34 contains over 125 trigger combinations providing a complete set of triggers - including runt, logic, pulse width/glitch, setup and hold violation, serial packet, and parallel data - to help quickly locate your event of interest. And with up to a 10 M record length, you can capture many events of interest, even thousands of serial packets, in a single acquisition for further analysis while maintaining high resolution to zoom in on fine signal details.
Verifying that your prototype's performance matches simulations and meets the project's design goals requires careful analysis, ranging from simple checks of rise times and pulse widths to sophisticated power loss analysis, characterization of system clocks, and investigation of noise sources.
The MDO34 offers a comprehensive set of standard analysis tools including:
Measurement results tables provide comprehensive statistical views of measurement results.
Tektronix MDO34