Keithley 2510

• 50W TEC controller combined with DC measurement functions
• Provides autotuning capability for the thermal control loop
• Provides fully digital P-I-D control
• Designed to control temperature during laser diode module testing
• Wide temperature set point range (-50°C to +225°C) and high set point resolution (±.001°C) and stability (±.005°C)
• Compatible with a variety of temperature sensor inputs - thermistors, RTDs, and IC sensors.
• Maintains constant temperature, current, voltage, and sensor resistance
• AC Ohms measurement function checks for mechanical damage to the TEC
• Measures and displays TEC parameters during the control cycle
• Four-wire open/short lead detection
• Digital I/O and Trigger Link for sweep operations and synchronization
• IEEE-488 and RS0232 interfaces
• Compact, half-rack design

The Models 2510 and 2510-AT TEC SourceMeter instruments enhance Keithley's CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley's expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module's Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately.

The Model 2510-AT expands the capability of the Model 2510 by offering autotuning capability. P, I, and D (proportional, integral, andderivative) values for closed loop temperature control are determined by the instrument using a modified Zeigler-Nichols algorithm. This eliminates the need for users to determine the optimal values for these coefficients experimentally. In all other respects, the Model 2510 and Model 2510-AT provide exactly the same set of features and capabilities.

• Control and production testing of thermoelectric coolers (Peltier devices) in:
• Laser diode modules
• IR charge-coupled device (CCD) arrays and charge-injection devices (CID)
• Cooled photodetectors
• Thermal-optic switches
• Temperature controlled fixtures