The Quadtech 1730 features measurement of 12 impedance parameters, 0.1% accuracy, test frequencies to 100 kHz, high resolution LCD graphical display, plus monitoring of AC voltage and current to the device under test.
The 1730 will measure, display, and output the results of any two parameters, including: series or parallel capacitance (C), AC resistance (R), or Inductance (L), dissipation factor (D), quality factor (Q), equivalent series resistance (ESR), impedance (Z), reactance (X), and phase angle (q). The unit's basic measurement accuracy is 0.1% and provides seven programmable test frequencies (100 and 120 Hz, 1, 10, 20, 50 and 100 kHz) for characterizing devices over a wide range. The large, high resolution LCD graphic display makes for clear, concise measurement results and provides a user friendly menu interface for easy setup and programming. A test signal monitoring function displays the voltage across and current through the test device, leaving no doubt what the actual test conditions are.
The 1730 offers a number of other exceptional features including, setup storage, fast measure speed, programmable source impedance, and binning capability. The test operator has the ability to store and recall up to 50 unique test setups from the instrument's internal memory. This ensures that a test can be configured quickly and run the same way every time. A choice of three measure modes are available (fast, medium, and slow) for varying degrees of accuracy and speed up to 62 measurements/sec. The 1730 provides the operator with the ability to select the instrument source impedance at 25/100 ohms, 25 ohms, or 10 ohms constant current mode, a very useful function when comparing measurements to those made on other testers. The unit also includes a programmable Hi/Lo comparator function and 8 sorting bins for pass/fail testing and categorization of components.
Additionally the 1730 includes the IEEE-488 and handler interfaces for adapting to production environments or remote control and datalogging applications.
QuadTech's Model 1730 LCR bridge is a microprocessor-based passive Go/No-Go component tester that exhibits fast measurement speed, even at lower test frequencies such as 100 Hz and 120 Hz. With its IEEE-488.2 and optically isolated handler interfaces, it should lend itself to reasonably fast automated discrete component testing, both in the lab and on the factory floor.
QuadTech 1730