The WAVECREST SIA-3000 sets a new reference standard for signal integrity analysis. This revolutionary test instrument dramatically improves test times in lab, production and ATE systems and more accurately measures data bus performance, set up and hold time. With 10 parallel channels and a built in GUI, the SIA-3000 provides unprecedented all-in-one functionality in a modular, upgradeable design. The SIA-3000 will be released later this year. Check back for updates throughout the year.Features
Test up to 10 channels in parallel - Unlike any other instrument available today, the SIA-3000 can test multiple channels for jitter and accuracy at the same time.
Input signal rates up to 3GHz or 4.5gb/s - Measure signal integrity at data rates up to 4.5 Gb/s with 200 femtosecond resolution enabling testing of faster channels and more accurate jitter measurements.
Enhanced throughput - Delivers unprecedented speed of test, allowing designers, integrators and test engineers to fully characterize complex communication paths in record time.
Integrated display and proven WAVECREST advanced analysis tools - The built-in flat panel display provides access to an intuitive GUI with scope-like usability.
Flexible, modular configuration - Configure the SIA-3000 depending on your needs. Choose the combination the best suits your needs for throughput and measurement rate. Options and upgrades can be added easily if your requirements change.
Ensure signal integrity in multiple applications - The SIA-3000 has a wide range of application specific capabilities including:
- Infiniband - Test to compliance on all channels simultaneously at speeds up to 4.5Gb/s per channel.
- Rambus DRCG - Perform full DRCG validation in seconds.
- Fibre Channel and Gigabit Ethernet - Test to compliance on all patterns and all channels simultaneously.
- DDR SRAM - Fully Characterize the data bus timing performance and Wide Bus BER.
- Microprocessor - Optimize clock and data timing using advanced WAVECREST algorithms for Wide Bus BER.
- PanelLink (DVI/TMDS/LVDS) - Characterize all data and clock channels of the interface for timing, jitter, skew rate, signal integrity and BER at the same time.
- Serial ATA - Fully diagnose signal-degenerating effects such and crosstalk, EMI, Gaussian noise and reference clock stability.
- Clock Distribution and PLL - Measure all types of jitter, including adjacent cycle jitter, signal integrity and short cycle probability, all in one solution.
- LAN - Test BER and waveform fidelity, as well as analyze signal integrity, on all signals simultaneously.
- SONET - Diagnose complex jitter problems on multi-port SONET switches and transceivers.
- XAUI - Test to compliance on all patters and all channels simultaneously, at speeds up to 4.5Gb/s.
Power Cord
